SBVS024F – NOVEMBER 2000 – REVISED SEPTEMBER 2005
250mA Low-Dropout Regulator
NEW DMOS TOPOLOGY:
Ultra Low Dropout Voltage:
150mV typ at 250mA
Required for Stability
FAST TRANSIENT RESPONSE
VERY LOW NOISE: 28
A at I
Not Enabled: I
2.5V, 2.8V, 2.85V, 3.0V, 3.3V, AND 5.0V
ADJUSTABLE OUTPUT VERSIONS
OTHER OUTPUT VOLTAGES AVAILABLE UPON
FOLDBACK CURRENT LIMIT
SMALL SURFACE-MOUNT PACKAGES:
SOT23-5, SOT223-5, and SO-8
The REG102 is a family of low-noise, low-dropout linear
regulators with low ground pin current. The new DMOS
topology provides significant improvement over previous
designs, including low-dropout voltage (only 150mV typ at
full load), and better transient performance. In addition, no
output capacitor is required for stability, unlike conventional
low-dropout regulators that are difficult to compensate and
require expensive low ESR capacitors greater than 1µF.
Typical ground pin current is only 600µA (at I
and drops to 10nA when not enabled. Unlike regulators with
PNP pass devices, quiescent current remains relatively con-
stant over load variations and under dropout conditions.
The REG102 has very low output noise (typically 28µVrms
= 3.3V with C
= 0.01µF), making it ideal for use
in portable communications equipment. On-chip trimming
results in high output voltage accuracy. Accuracy is main-
tained over temperature, line, and load variations. Key pa-
rameters are tested over the specified temperature range
(–40°C to +85°C).
The REG102 is well protected—internal circuitry provides a
current limit that protects the load from damage; furthermore,
thermal protection circuitry keeps the chip from being dam-
aged by excessive temperature. The REG102 is available in
SOT23-5, SOT223-5, and SO-8 packages.
PORTABLE COMMUNICATION DEVICES
PERSONAL DIGITAL ASSISTANTS
BACKUP POWER SUPPLIES
NOTE: (1) Optional.
NR = Noise Reduction
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 2000-2005, Texas Instruments Incorporated